As we continue our efforts to measure quality infrastructure (QI) development and improve QI data collection to understand QI’s contribution to economic growth, we turn our attention to metrology. We examined the relationship between the Global Quality Infrastructure Index (GQII) and the number of metrology patents filed to understand whether it would be a suitable proxy for metrology development.

One reason for investing in Quality Infrastructure (QI) is its contribution to a country’s economic growth. QI enhances economic performance through several avenues, including opening markets, reducing entry barriers, promoting knowledge transfer and better management procedures, facilitating production along value chains, enabling economies of scale, and reducing adverse selection and asymmetric information (Gonçalves and Peuckert, 2011).